Microscopy capabilities include scanning electron
microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy
(AFM). Each instrument is equipped with image analysis systems to aid in the study
of sample microstructure and morphology. Energy dispersive spectroscopy (EDS) is
also available for elemental characterization on the SEM and TEM. Several optical
microscopes are also available.
For further information, contact:
Dan Nicolella, Ph.D.
Materials Development Section
Materials Engineering Department
Mechanical Engineering Division
June 06, 2013