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Microscopy capabilities include scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM).  Each instrument is equipped with image analysis systems to aid in the study of sample microstructure and morphology.  Energy dispersive spectroscopy (EDS) is also available for elemental characterization on the SEM and TEM.  Several optical microscopes are also available.

For further information, contact: Dan Nicolella, Ph.D.

Materials Development Section separate.gif (834 bytes) Materials Engineering Department
Mechanical Engineering Division
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April 15, 2014