"Surface Flaw Detection Using Spatial Raman-Based Imaging"
Patent No.:	6,453,264
Inventor(s):	John F. Maguire, John David Busbee, Steven R. LeClair
Date of Issue:	9/17/2002
Assignee:	SwRI
Full Text:	US Patent & Trademark Office

Click on the inventor's name to view related technical resources:
John F. Maguire:	Former SwRI Employee, Chemistry & Chemical Engineering

For further information, contact the Communications Department, Southwest Research Institute.

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