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SwRI Research Technologies - Atomic Force Microscopy (AFM)

- Atomic Force Microscopy (AFM) -

Atomic Force Microscopy (AFM)

AFM images topography of a surface with nanometer resolution and is used to evaluate surface structure of semiconductors, polymers, adhesive materials, and biological samples. The XE-100 AFM operates in various contact and noncontact modes to measure surface properties.

Systems Research & Products; Technology & Operations; Applied Power

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Southwest Research Institute^®(SwRI^®), headquartered in San Antonio, Texas, is a multidisciplinary, independent, nonprofit, applied engineering and physical sciences research and development organization with 11 technical divisions.

November 02, 2010