| The SwRI Component-Analysis Group specializes in failure analysis of electronic and electrical components. Included in the Group's experience are (1) integrated circuits (e.g., operational amplifiers, logic devices, voltage regulators, etc.), (2) discrete semiconductor devices (e.g., transistors, diodes, optoelectronic devices, silicon controlled rectifiers, etc.), and (3) a wide variety of other electronic and electrical components. Laboratory equipment supports key failure-analysis operations including photography, optical microscopy, x-radiography, package opening, scanning-electron microscopy, elemental analysis by energy-dispersive x-ray spectroscopy, cross sectioning (both mounted and unmounted), microprobing, wet-chemical and plasma etching, hermeticity testing, and particle-impact-noise detection. |
