Abstract:
A relatively compact dual ion composition instrument and associated methodology for measuring plasma and ion populations in a variety of interplanetary and planetary environments. The unitary device can measure mass and ionic charge state compositions and 3D velocity distributions of 10 eV/q to 40 keV/q plasma and pick-up ions; and (2) mass composition, energy spectra and angular distributions of 30 keV to 10 MeV energetic ions.
Patent Number:
9,613,789
Date Of Issue:
04/04/2017
Inventors:
Mihir I. Desai; Keiichi Ogasawara; David J. McComas; Stefano Livi
Full Text: