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Flexible Eddy Current Test Probe Using a Shape-Memory Alloy for Surface Conformance: 10,895,554

Abstract: 

A conforming eddy current testing (ECT) probe for per­forming eddy current testing when placed on the surface of a test object. An eddy current array is fabricated on a flexible substrate. A shape metal alloy (SMA) piece is manufactured to have an original shape that conforms to the surface of the test object, and then affixed to the substrate. The SMA piece has as much or more flexibility than the substrate, so that it can be manipulated into position. Just prior to testing, the SMA piece is actuated to revert to its original shape. 

Patent Number: 
10,895,554
Date Of Issue: 
01/19/2021
Inventors: 

Jonathan D. Bartlett; Albert J. Parvin, Jr.