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Omni-Directional Guided Wave Testing of Plate Structures Using Probe Having Rotating Guided Wave Sensor: 10,739,314

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Abstract: 

A guided wave probe for use in guided wave testing of plate structures. The probe comprises a cup having a flat or nearly flat bottom, and a guided wave sensor, such as a magneto­strictive sensor, placed in the bottom of the cup. The sensor and/or cup are coupled to the plate structure, such that ultrasonic energy from the sensor is transmitted to the cup and the plate surface. The sensor is incrementally rotated in the cup, and sensor data is acquired at each incremental position.

Patent Number: 
10,739,314
Date Of Issue: 
08/11/2020
Inventors: 

Sergrey Vinogradov; Adam C. Cobb; Jonathan D. Bartlett; Greg A. Bustamante; Douglas R. Earnest; Clinton J. Thwing

Full Text: 
US Patent and Trademark Office