Abstract:
A method and system for simulating defects in conduits, where the defects are detected using long-range guided-wave inspection techniques. The guided wave interaction with a defect is treated as a one-dimensional problem of plane wave reflection from a boundary of different acoustic impedances. The defect waveform is simulated using an electrical transmission line model and inverse fast Fourier transformation.
Patent Number:
7,634,392
Date Of Issue:
12/14/2009
Inventors:
Hegeon Kwun; Sang-Young Kim; Myoung-Seon Choi
Full Text: