Metrology 3D Scanning System and Method

Abstract

A metrology three-dimensional (3D) scanning system includes a metrology 3D scanning application (app) comprising computing instructions that, when executed by one or more processors, causing the one or more processors to: record human-robot interaction (HRI) data as a human operator operates the HRI device; generate a preliminary scan path based on the HRI data for operating a robotic element within an operating environment; move the robotic element along at least a portion of the preliminary scan path and record preliminary scan data comprising at least a subset of dimension data defining at least a target object; generate a metrology scanning path plan and a motion plan for the robotic element based on the preliminary scan data; and execute instructions to move the robotic element within the operating environment according to the metrology scanning path plan and the motion plan for scanning the target object.

Patent Number
12,460,921
Date Of Issue
Inventors

Mingu Kang; Levi Armstrong; Matthew M. Robinson; Marc Alban; Brad Johnson; James Clark