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Single Event Upset Immune Comparator

Abstract: 

A single event upset immune analog comparator which comprises simple comparators with either open-collector, or non-open-collector outputs. Input voltage and/or current compensation may also be provided by duplicating external reference circuitry for presentation to the comparator reference inputs. Various embodiments of the single event upset immune analog comparator may also comprise single event upset immune AND gates, OR gates, or invertors, as determined by particular design requirements.

Patent Number: 
6,252,433
Date Of Issue: 
06/26/2001
Inventors: 

Toby James Stecklein