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Surface Flaw Detection Using Spatial Raman-Based Imaging

Abstract: 

A Raman-based spatial analysis method of detecting surface flaws. Special filters and optics are used to acquire filtered Raman response data from a portion of the surface. The filtered Raman response data represents the Raman response of the surface at a selected frequency. A camera records the response, thereby providing a two dimensional image of the portion of the surface. The image may be analyzed to determine whether that portion has desired thickness and chemical characteristics.

Patent Number: 
6,453,264
Date Of Issue: 
09/17/2002
Inventors: 

John Francis Maguire;John David Busbee;Steven R. LeClair