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Time Shift Data Analysis for Long-Range Guided Wave Inspection

Abstract: 

A method of analysis long range guided wave data reflected from defects and geometric features such as welds in a structure. The method involves acquiring two sets of data, and time shifting one set of data relative to the other. Data points that match in time after the shifting are considered to represent defects or geometric features in the structure. The result of the method is exclusion of false signal data and automation of data analysis.

Patent Number: 
6,925,881
Date Of Issue: 
08/09/2005
Inventors: 

Hegeon Kwun; Kim Sang-Young