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Simulation of Guided Wave Reflection Signals Representing Defects in Conduits

Abstract: 

A method and system for simulating defects in conduits, where the defects are detected using long-range guided-wave inspection techniques. The guided wave interaction with a defect is treated as a one-dimensional problem of plane wave reflection from a boundary of different acoustic impedances. The defect waveform is simulated using an electrical transmission line model and inverse fast Fourier transformation.

Patent Number: 
7,634,392
Date Of Issue: 
12/15/2009
Inventors: 

Hegeon Kwun; Sang-Young Kim; Myoung-Seon Choi