Abstract:
A Raman-based spatial analysis method of detecting surface flaws. Special filters and optics are used to acquire filtered Raman response data from a portion of the surface. The filtered Raman response data represents the Raman response of the surface at a selected frequency. A camera records the response, thereby providing a two dimensional image of the portion of the surface. The image may be analyzed to determine whether that portion has desired thickness and chemical characteristics.
Patent Number:
6,453,264
Date Of Issue:
09/16/2002
Inventors:
John Francis Maguire; John David Busbee; Steven R. LeClair
Full Text: