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System and Method for Producing Color Contour Maps of Surface Defects of High Pressure Pipelines

Abstract: 

A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.

Patent Number: 
7,557,570
Date Of Issue: 
07/07/2009
Inventors: 

Alfred E. Crouch;Todd Goyen;Patrick C. Porter;Shawn Laughlin